Tomas Murauskas
Researcher, Assistant Professor
Research Area
X-ray photoelectron spectroscopic studies of various materials (XPS). Chemical synthesis of thin layers of inorganic functional materials by chemical vapour deposition (MOCVD). Structural characterisation of materials by chemical and physical research methods. The main areas of functional materials are functional perovskite-type electrically conductive and light-transmitting materials for optoelectronic applications, piezoelectric/ferroelectric functional materials, various optical thin-film coatings for optical components. Structural and surface studies of materials by X-ray diffraction, X-ray photoelectron spectroscopy, scanning electron and atomic force microscopy, Raman spectroscopy and other methods.
Scientific Interests, Keywords
X-ray photoelectron spectroscopy, XPS,
Surface analysis,
MOCVD, XRD, AFM
Links to External Profile
ORCID: https://orcid.org/0000-0002-4515-3807
ResearchGate: https://www.researchgate.net/profile/Tomas-Murauskas
Participation in the national/international governing bodies, commissions, committees, boards etc.
The oral defence committee member for bachelor/master thesis students